No. | parte # | Fabricante | Descripción | Hoja de Datos |
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Sanyo Semiconductor Corporation |
2SC4458 · High breakdown voltage, high reliability. · Fast switching speed. · Wide ASO. · Adoption of MBIT process. www.DataSheet4U.com · Micaless package facilitating mounting. Package Dimensions unit:mm 2039D [2SC4458] 3.4 16.0 5.0 8.0 5.6 3.1 21.0 22.0 |
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Hitachi Semiconductor |
Silicon NPN Transistor B dB dB Unit V V V µA µA V Test conditions I C = 10 µA, IE = 0 I C = 1 mA, RBE = ∞ I E = 10 µA, IC = 0 VCB = 18 V, IE = 0 VEB = 2 V, IC = 0 VCE = 12 V, IC = 2 mA VCE = 12 V, IC = 2 mA I C = 10 mA, IB = 1 mA VCE = 12 V, IC = 2 mA VCB = 10 V, IE = 0, f |
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Mospec Semiconductor |
2SC4242 |
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Panasonic Semiconductor |
2SC4212 I Absolute Maximum Ratings TC = 25°C www.DataSheet4U.com Parameter Collector to base voltage Collector to emitter voltage Emitter to base voltage Peak collector current Collector current Collector power dissipation Symbol VCBO VCEO VEBO ICP IC PC Tj |
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Toshiba Semiconductor |
Silicon NPN Transistor mA, IB = 1.5 mA VCB = 10 V, IE = 0, f = 1 MHz VCB = 10 V, IC = 1 mA, f = 30 MHz VCE = 10 V, IC = 10 mA Min Typ. Max Unit ¾ ¾ 0.1 mA ¾ ¾ 0.1 mA 25 ¾ ¾ V 20 70 200 ¾ ¾ 0.2 V ¾ ¾ 1.5 ¾ 1.1 1.6 pF ¾ ¾ 25 ps 250 600 ¾ MHz Marking 1 2003-03-19 |
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Hitachi Semiconductor |
NPN TRANSISTOR — — — 0.5 0.5 320 0.2 0.75 — 3.5 10 — — — — µS V V MHz pF dB kΩ × 10 –6 Unit V V V µA µA Test conditions I C = 10 µA, IE = 0 I C = 1 mA, RBE = ∞ I E = 10 µA, IC = 0 VCB =18 V, IE = 0 VEB = 2 V, IC = 0 VCE = 12 V, IC = 2 mA I C = 10 mA, IB = 1 mA VCE |
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Hitachi Semiconductor |
Silicon NPN Transistor 0 mA, IB = 4 mA VCE = 10 V, IC = 10 mA VCE = 10 V, IC = 10 mA VCB = 10 V, IE = 0, emitter common, f = 1 MHz VCC = 12 V, IC = 2 mA, f = 200 MHz f OSC = 230 Mhz (0 dBm), f out = 30 MHz Conversion gain Noise figure Note: Marking is “HC”. CG NF — — 2 |
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Inchange Semiconductor |
Silicon NPN Transistor unless otherwise specified SYMBOL PARAMETER CONDITIONS MIN TYP. MAX UNIT VCEO Collector-Emitter Voltage IC=1mA ; RBE=∞ 42 58 V VCBO Collector-Emitter Sustaining Voltage IC= 0.1mA ;I 60 V VCE(sat)-1 Collector-Emitter Saturation Voltage IC= |
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Sanyo Semiconductor |
2SC4572 · High breakdown voltage. · Small Cob. · High reliability (Adoption of HVP process). www.DataSheet4U.com 3.6 Package Dimensions unit:mm 2010C [2SC4572] 10.2 5.1 2.7 6.3 4.5 1.3 18.0 5.6 1.2 14.0 15.1 0.8 0.4 1 2 3 2.7 Specifications Absol |
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Inchange Semiconductor |
2SC4148 tor-emitter sustaining voltage Collector-emitter saturation voltage Base-emitter saturation voltage Collector cut-off current At rated volatge ICEO IEBO hFE fT Collector cut-off current Emitter cut-off current DC current gain Transition frequency At |
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Toshiba Semiconductor |
Silicon NPN Transistor VEB = 2 V, IC = 0 IC = 1 mA, IB = 0 VCE = 10 V, IC = 2 mA VCB = 10 V, IE = 0, f = 1 MHz VCE = 10 V, IC = 2 mA VCC = 12 V, VAGC = 1.4 V f = 200 MHz (Figure 1) VCC = 12 V, GR = 30dB f = 200 MHz ¾ ¾ 100 nA ¾ ¾ 100 nA 30 ¾ ¾ V 60 150 300 ¾ 0.35 0.5 |
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Sanyo Semiconductor |
2SC4108 · High breakdown voltage and high reliability. · Fast switching speed. · Wide ASO. · Adoption of MBIT process. www.DataSheet4U.com Package Dimensions unit:mm 2022A [2SC4108] 2.6 3.5 15.6 14.0 3.2 4.8 2.0 1.6 1.3 1.2 15.0 20.0 2.0 20.0 1.4 0 |
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Sanyo Semiconductor Corporation |
2SC4204 · Adoption of MBIT process. · High DC current gain (hFE=800 to 3200). · Large current capacity (IC=0.7A). · Low collector-to-emitter saturation voltage (VCE(sat)≤0.5V). · High VEBO (VEBO≥15V). 0.45 0.5 0.6 2.0 0.45 0.44 14.0 5.0 1 2 3 Specifica |
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Toshiba Semiconductor |
2SC4408 |
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Hitachi Semiconductor |
2SC4367 µA, IC = 0 VCB = 10 V, IE = 0 VCE = 10 V, IC = 10 mA I C = 20 mA, IB = 4 mA VCE = 10 V, IC = 10 mA VCB = 10 V, IE = 0, f = 1 MHz 2 2SC4367 Typical Output Characteristics Maximum Collector Dissipation Curve Collector Power Dissipation PC (mW) 600 Co |
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Toshiba Semiconductor |
NPN TRANSISTOR esign the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 1 |
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Inchange Semiconductor |
Silicon NPN Transistor VEB= 1V;IC= 0 hFE DC Current Gain IC= 7mA ; VCE= 3V fT Current-Gain—Bandwidth Product IC= 7mA ; VCE= 3V Cre Output Capacitance Ie= 0 ; VCB= 10V, ftest= 1MHz VCE=3V,IC=3mA,f=1GHz |S21|2 Power Gain VCE=3V,IC=5mA,f=1GHz VCE=3V,IC=7mA,f=1GHz |
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Hitachi Semiconductor |
Silicon NPN Transistor t Collector output capacitance Note: Grade hFE V(BR)EBO I CBO hFE* VBE VCE(sat) fT Cob 250 — — — — V V MHz pF I C = 200 mA, IB = 20 mA VCE = 10 V, IC = 50 mA VCB = 30 V, f = 1 MHz, IE = 0 1. The 2SC4046 is grouped by h FE as follows. D 250 to 500 |
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Inchange Semiconductor |
Silicon NPN Transistor OL PARAMETER CONDITIONS MIN TYP. MAX UNIT V(BR)EBO Emitter-Base Breakdown Voltage IE= 300mA ; IC= 0 VCE(sat) Collector-Emitter Saturation Voltage IC= 4.5A; IB= 1.3A VBE(sat) Base-Emitter Saturation Voltage IC= 4.5A; IB= 1.3A ICBO Collector |
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Inchange Semiconductor |
Silicon NPN Transistor B= 4mA ICBO Collector Cutoff Current VCB= 15V; IE= 0 ICEO Collector Cutoff Current VCE= 13V; RBE= ∞ IEBO Emitter Cutoff Current VEB= 3V; IC= 0 hFE DC Current Gain IC= 5mA ; VCE= 5V fT Current-Gain—Bandwidth Product IC= 20mA ; VCE= 5V |
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