No. | parte # | Fabricante | Descripción | Hoja de Datos |
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Toshiba Semiconductor |
2SC4688 bility upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 1 http://store.iiic.cc/ 2006- |
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Toshiba Semiconductor |
NPN TRANSISTOR frequency Collector output capacitance Symbol Test Condition ICBO IEBO V (BR) CEO hFE (1) hFE (2) VCE (sat) VBE fT Cob VCB = 30 V, IE = 0 VEB = 6 V, IC = 0 IC = 10 mA, IB = 0 VCE = 1 V, IC = 0.5 A VCE = 1 V, IC = 3 A IC = 3 A, IB = 30 mA VCE = 1 |
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Toshiba Semiconductor |
NPN TRANSISTOR bility upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 1 http://store.iiic.cc/ 2006- |
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Toshiba Semiconductor |
2SC4686 |
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Toshiba Semiconductor |
NPN TRANSISTOR |
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Toshiba Semiconductor |
Silicon NPN TRANSISTOR gn the appropriate reliability upon reviewing the Weight: 0.006 g (typ.) Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated |
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Toshiba Semiconductor |
Silicon NPN TRANSISTOR urrent/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliabilit |
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Toshiba Semiconductor |
NPN TRANSISTOR |
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Toshiba Semiconductor |
NPN TRANSISTOR r cut-off current Collector-emitter breakdown voltage DC current gain Collector-emitter saturation voltage Base-emitter voltage Transition frequency Collector output capacitance Symbol ICBO IEBO VCEO hFE (1) hFE (2) VCE (sat) VBE fT Cob Test Condit |
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Toshiba Semiconductor |
NPN TRANSISTOR ctrical Characteristics (Ta = 25°C) Characteristics Collector cut-off current Emitter cut-off current Collector-emitter breakdown voltage DC current gain Collector-emitter saturation voltage Base-emitter voltage Transition frequency Collector output |
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Toshiba Semiconductor |
NPN TRANSISTOR |
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Toshiba Semiconductor |
NPN TRANSISTOR reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Han |
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Toshiba Semiconductor |
NPN TRANSISTOR reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Han |
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Toshiba Semiconductor |
NPN TRANSISTOR sat) VBE fT Cob VCE = 5 V, IC = 4 A IC = 6 A, IB = 0.6 A VCE = 5 V, IC = 4 A VCE = 5 V, IC = 1 A VCB = 10 V, IE = 0, f = 1 MHz Note: hFE (1) classification R: 55 to 110, O: 80 to 160 JEDEC ― JEITA ― TOSHIBA 2-16F1A Weight: 5.8 g (typ.) Min |
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Toshiba Semiconductor |
NPN TRANSISTOR ) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliabili |
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Toshiba Semiconductor |
NPN TRANSISTOR CEO hFE (1) hFE (2) VCE (sat) VBE (sat) fT Cob ton IB1 Test Condition VCB = 80 V, IE = 0 VEB = 6 V, IC = 0 IC = 10 mA, IE = 0 VCE = 2 V, IC = 100 mA VCE = 2 V, IC = 2 A IC = 1.5 A, IB = 75 mA IC = 1.5 A, IB = 75 mA VCE = 2 V, IC = 100 mA VCB = 10 V, |
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Toshiba Semiconductor |
NPN TRANSISTOR |
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