No. | parte # | Fabricante | Descripción | Hoja de Datos |
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Toshiba Semiconductor |
Variable Capacitance Diode |
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Toshiba Semiconductor |
Silicon Diode |
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Toshiba Semiconductor |
Variable Capacitance Diode |
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Toshiba Semiconductor |
Diode mprove the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when |
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Toshiba Semiconductor |
BARIABLE CAPACITANCE DIODE |
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Toshiba Semiconductor |
Variable Capacitance Diode C (25) (25) ´ 100 (%) 2 2003-04-02 1SV230 RESTRICTIONS ON PRODUCT USE 000707EAA · TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail d |
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Toshiba Semiconductor |
Diode ty to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOS |
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Toshiba Semiconductor |
Variable Capacitance Diode 1: Characteristic between anode 1 and anode 2 Note 2: Units are compounded in one package and are matched to 2.5% C (max) - C (min) C (min) =< 0.025 (VR = 1~28 V) Marking 1 2003-04-02 1SV242 (Note 3) Note 3: dC = C (Ta) - C C (25) (25) |
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Toshiba Semiconductor |
Variable Capacitance Diode ilure rate, etc). Electrical Characteristics (Ta = 25°C) Characteristics Reverse voltage Reverse current Capacitance Capacitance Capacitance ratio Series resistance Symbol Test Condition VR IR C2V C10V C2V / C10V rs IR = 1 μA VR = 15 V VR = 2 V |
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Toshiba Semiconductor |
VARIABLE CPACITANCE DIODE |
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Toshiba Semiconductor |
Variable Capacitance Diode |
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Toshiba Semiconductor |
Variable Capacitance Diode |
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Toshiba Semiconductor |
Variable Capacitance Diode |
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Toshiba Semiconductor |
Variable Capacitance Diode e to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoi |
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Toshiba Semiconductor |
Variable Capacitance Diode uality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TO |
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Toshiba Semiconductor |
Variable Capacitance Diode ¾ 1.0 V nA pF pF ¾ W 1 2003-04-02 1SV217 CAPACITANCE CHANGE RATIO @C (%) (Note 2) Note 2: dC = C (Ta) - C C (25) (25) ´ 100 (%) 2 2003-04-02 1SV217 RESTRICTIONS ON PRODUCT USE 000707EAA · TOSHIBA is continually working to improve th |
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Toshiba Semiconductor |
Silicon Diode JEITA ― TOSHIBA 1-1E1A Weight: 0.004 g (typ.) Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Reverse voltage Reverse current Capacitance Capacitance Capacitance ratio Series resistance VR IR C1V C4V C1V / C4V |
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Toshiba Semiconductor |
Diode |
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Toshiba Semiconductor |
BARIABLE CAPACITANCE DIODE |
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Toshiba Semiconductor |
Diode d failure rate, etc). Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Reverse voltage Reverse current Forward voltage Total capacitance Series resistance VR IR = 10 μA IR VR = 50 V VF IF = 50 mA (Note) CT VR = 50 V, |
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