SCANPSC110F Port Datasheet, Distribuidor, stock y mejor precio

Part Number	SCANPSC110F
Manufacturer	Fairchild Semiconductor
Title	SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port
Description	The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. .
Features	s True IEEE1149.1 hierarchical and multidrop addressable capability s The 6 slot inputs support up to 59 unique addresses, a Broadcast Address, and 4 Multi-cast Group Addresses s 3 IEEE 1149.1-compatible configurable local scan ports s Mode Register allows local TAPs to be bypassed, selected for insertion into the scan chain individually, or serially in groups of two or three s 32-bit TCK counter .

No.	Parte #	Fabricante	Descripción
1	SCANPSC100F	Texas Instruments	Embedded Boundary Scan Controller
2	SCAN12100	National Semiconductor	CPRI SerDes
3	SCAN15MB200	ETCTI	SCAN15MB200 Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer w/Pre-Emphasis IEEE 1149.6 (Rev. E)
4	SCAN16512	National Semiconductor	Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver
5	SCAN16602	National Semiconductor	Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver
6	SCAN182245A	Fairchild Semiconductor	Non-Inverting Transceiver
7	SCAN182245A	National Semiconductor	Non-Inverting Transceiver
8	SCAN18245T	National Semiconductor	Non-Inverting Transceiver with TRI-STATE Outputs
9	SCAN18245T	Fairchild Semiconductor	Non-Inverting Transceiver
10	SCAN18373T	National Semiconductor	Transparent Latch with TRI-STATE Outputs

SCANPSC110F Datasheet. existencias, precio