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SCANPSC110F |
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| Part Number | SCANPSC110F |
| Manufacturer | Fairchild Semiconductor |
| Description | The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput... |
| Features |
s True IEEE1149.1 hierarchical and multidrop addressable capability s The 6 slot inputs support up to 59 unique addresses, a Broadcast Address, and 4 Multi-cast Group Addresses s 3 IEEE 1149.1-compatible configurable local scan ports s Mode Register allows local TAPs to be bypassed, selected for insertion into the scan chain individually, or serially in groups of two or three s 32-bit TCK counter s 16-bit LFSR Signature Compactor s L4 s local TAPs can be 3-stated via the OE input to allow an alternate test master to take control of the local TAPs
Ordering Code:
Order Number SCANPSC110FSC Pack... |
| Document |
 SCANPSC110F Data Sheet
PDF 273.25KB |
Similar Datasheet
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Desde 2024. D4U Semiconductor.
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