| No. | parte # | Fabricante | Descripción | Hoja de Datos |
|---|---|---|---|---|
|
|
|
Toshiba Semiconductor |
HIGH EFFICIENCY DIODE STACK usly under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating tem |
|
|
|
|
Toshiba Semiconductor |
HIGH EFFICIENCY DIODE STACK usly under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating tem |
|
|
|
|
Toshiba Semiconductor |
SCHOTTKY BARRIER RECTIFIER STACK ntly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Preca |
|
Desde 2024. D4U Semiconductor.
|