No. | parte # | Fabricante | Descripción | Hoja de Datos |
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Toshiba Semiconductor |
2SD2462 solute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and es |
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Toshiba Semiconductor |
2SD2498 ARACTERISTICS (Tc = 25°C) 2SD2498 CHARACTERISTIC Collector Cut−off Current Emitter Cut−off Current Collector−Emitter Breakdown Voltage DC Current Gain Collector−Emitter Saturation Voltage Base−Emitter Saturation Voltage Transition Frequency Co |
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Toshiba Semiconductor |
2SD2499 if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions” |
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Toshiba Semiconductor |
Silicon NPN Transistor FE (2) VCE (sat) VBE fT Cob VCB = 60 V, IE = 0 VEB = 7 V, IC = 0 IC = 50 mA, IB = 0 VCE = 5 V, IC = 0.1 A VCE = 5 V, IC = 1 A IC = 0.5 A, IB = 5 mA VCE = 5 V, IC = 0.5 A VCE = 5 V, IC = 0.5 A VCB = 10 V, IE = 0, f = 1 MHz Marking D2461 Product No |
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Toshiba Semiconductor |
NPN Transistor solute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and es |
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Toshiba Semiconductor |
Silicon NPN Transistor n voltage Symbol Test Condition ICBO IEBO V (BR) CEO hFE VCE (sat) VBE (sat) VCB = 30 V, IE = 0 VEB = 10 V, IC = 0 IC = 10 mA, IB = 0 VCE = 2 V, IC = 150 mA IC = 1 A, IB = 1 mA IC = 1 A, IB = 1 mA Min Typ. Max Unit ― ― 10 µA ― ― 10 µA 30 ― ― |
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Toshiba Semiconductor |
Silicon NPN Transistor age Base-emitter saturation voltage Transition frequency Collector output capacitance Symbol Test Condition ICBO VCB = 100 V, IE = 0 ICER VCE = 80 V, RBE = 50 Ω IEBO VEB = 15 V, IC = 0 V (BR) CEO IC = 50 mA, IB = 0 hFE (1) (Note) VCE = 5 V |
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Toshiba Semiconductor |
Silicon NPN Transistor 60 V, IE = 0 IEBO VEB = 5 V, IC = 0 V (BR) CEO IC = 50 mA, IB = 0 hFE (1) (Note) VCE = 5 V, IC = 8 A hFE (2) VCE (sat) VBE fT Cob VCE = 5 V, IC = 12 A IC = 8 A, IB = 8 mA VCE = 5 V, IC = 8 A VCE = 5 V, IC = 1 A VCB = 10 V, IE = 0, f = 1 MHz ― |
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Toshiba Semiconductor |
Silicon NPN Transistor if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions” |
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Toshiba Semiconductor |
2SD2449 |
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Toshiba Semiconductor |
Silicon NPN Transistor iba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 1 2006-11-21 Electrical Characteristics (Tc = 25°C) Char |
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Toshiba Semiconductor |
Silicon NPN Transistor Symbol Test Condition ICBO IEBO V (BR) CEO hFE (1) hFE (2) VCE (sat) VBE (sat) fT Cob VCB = 100 V, IE = 0 VEB = 5 V, IC = 0 IC = 50 mA, IB = 0 VCE = 1 V, IC = 1 A VCE = 1 V, IC = 4 A IC = 4 A, IB = 0.4 A IC = 4 A, IB = 0.4 A VCE = 4 V, IC = 1 A |
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Toshiba Semiconductor |
Silicon NPN Transistor ctor-emitter saturation voltage Base-emitter saturation voltage Transition frequency Collector output capacitance Symbol Test Condition ICBO IEBO V (BR) CEO hFE VCE (sat) VBE (sat) fT Cob VCB = 80 V, IE = 0 VEB = 8 V, IC = 0 IC = 10 mA, IB = 0 VC |
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Toshiba Semiconductor |
NPN Transistor (Tc = 25°C) CHARACTERISTIC Collector Cut−off Current Emitter Cut−off Current Collector−Emitter Breakdown Voltage DC Current Gain Collector−Emitter Saturation Voltage Base−Emitter Saturation Voltage Transition Frequency Collector Output Capacitance Sw |
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