No. | parte # | Fabricante | Descripción | Hoja de Datos |
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ToshibaSemiconductor |
HIGH EFFICIENCY DIODE STACK usly under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating tem |
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Toshiba Semiconductor |
SCHOTTKY BARRIER TYPE (SWITCHING TYPE POWER SUPPLY CONVERTER & CHOPPER APPLICATIONS) ltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Pl |
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Toshiba Semiconductor |
DIODE STACK |
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Toshiba Semiconductor |
SCHOTTKY BARRIER RECTIFIER cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please k |
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Toshiba Semiconductor |
SCHOTTKY BARRIER TYPE (SWITCHING TYPE POWER SUPPLY/ CONVERTER & CHOPPER APPLICATIONS) |
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Toshiba Semiconductor |
SCHOTTKY BARRIER RECTIFIER STACK |
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ToshibaSemiconductor |
SCHOTTKY BARRIER RECTIFIER STACK ntly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Preca |
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Toshiba Semiconductor |
SILICON EPITAXIAL TYPE HIGH EFFICIENCY DIODE STACK ics 5DL2C48A Peak forward voltage U5DL2C48A 5FL2C48A U5FL2C48A Repetitive peak reverse current Reverse recovery time Forward recovery time Thermal resistance Symbol Test Condition VFM IFM = 2.5 A IRRM trr tfr Rth (j-c) VRRM = Rated IF = |
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Toshiba Semiconductor |
SILICON EPITAXIAL TYPE HIGH EFFICIENCY DIODE STACK ics 5DL2C48A Peak forward voltage U5DL2C48A 5FL2C48A U5FL2C48A Repetitive peak reverse current Reverse recovery time Forward recovery time Thermal resistance Symbol Test Condition VFM IFM = 2.5 A IRRM trr tfr Rth (j-c) VRRM = Rated IF = |
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Toshiba Semiconductor |
DIODE STACK |
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Toshiba Semiconductor |
SCHOTTKY BARRIER RECTIFIER STACK |
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Toshiba Semiconductor |
HIGH EFFICIENCY DIODE STACK |
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Toshiba Semiconductor |
2SC4868 |
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ToshibaSemiconductor |
HIGH EFFICIENCY DIODE STACK usly under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating tem |
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Toshiba Semiconductor |
NPN TRANSISTOR cal Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Collector cut-off current Emitter cut-off current DC current gain Output capacitance Reverse transfer capacitance ICBO IEBO hFE Cob Cre VCB = 10 V, IE = 0 VEB = 1 V, IC |
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Toshiba Semiconductor |
NPN TRANSISTOR istics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Collector cut-off current Emitter cut-off current DC current gain Output capacitance Reverse transfer capacitance ICBO IEBO hFE Cob Cre VCB = 10 V, IE = 0 VEB = 1 V, IC |
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Toshiba Semiconductor |
NPN TRANSISTOR Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Collector cut-off current Emitter cut-off current DC current gain Output capacitance Reverse transfer capacitance ICBO IEBO hFE Cob Cre VCB = 10 V, IE = 0 VEB |
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Toshiba Semiconductor |
NPN TRANSISTOR ctrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Collector cut-off current Emitter cut-off current DC current gain Output capacitance Reverse transfer capacitance ICBO IEBO hFE Cob Cre VCB = 10 V, IE |
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Toshiba Semiconductor |
NPN TRANSISTOR Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Collector cut-off current Emitter cut-off current DC current gain Output capacitance Reverse transfer capacitance ICBO IEBO hFE Cob Cre VCB = 10 V, IE = 0 VEB |
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Toshiba Semiconductor |
NPN TRANSISTOR teristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Collector cut-off current Emitter cut-off current DC current gain Output capacitance Reverse transfer capacitance ICBO IEBO hFE Cob Cre VCB = 10 V, IE = 0 VEB = 1 V, |
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