No. | parte # | Fabricante | Descripción | Hoja de Datos |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Grade 0 safety power system with two failsafe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2 and -5 standards. High temperature capability up |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Fail-safe system basis chip with fail-safe output, becoming a full part of a safety-oriented system partitioning, covering ASIL D safety integrity level. It is developed in compliance with ISO 26262 standard and it is qualified in compliance with AEC-Q100 rev H (Grade1, MSL3). |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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NXP |
Safety power system basis chip with two fail-safe outputs, becoming a full part of a safety oriented system partitioning, to reach a high integrity safety level (up to ASIL D). The built-in CAN FD interface fulfills the ISO 11898-2(12) and -5(13) standards. The LIN interface fulf |
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