| No. | parte # | Fabricante | Descripción | Hoja de Datos |
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NTE Electronics |
(HD Series) HIGH-FREQ ALUMINUM ELECTROLYTIC C ( –13°F to +185°F) Leakage Current: I ≤ 0.2CV (measured after 5 minutes of applied rated voltage) I = Leakage Current (µA) C = Nominal Capacitance (µf) V = Rated Voltage (V) Capacitance Tolerance: ±20% (M) measured at +20°C (+68°F), 1kHZ Load Life: |
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NTE Electronics |
(HD Series) HIGH-FREQ ALUMINUM ELECTROLYTIC C ( –13°F to +185°F) Leakage Current: I ≤ 0.2CV (measured after 5 minutes of applied rated voltage) I = Leakage Current (µA) C = Nominal Capacitance (µf) V = Rated Voltage (V) Capacitance Tolerance: ±20% (M) measured at +20°C (+68°F), 1kHZ Load Life: |
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Desde 2024. D4U Semiconductor.
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