No. | parte # | Fabricante | Descripción | Hoja de Datos |
---|---|---|---|---|
|
|
Microsemi |
Rad Hard NPN Silicon High Speed Switching Transistor JEDEC registered 2N2369 TID level screened per MIL-PRF-19500 Also available with ELDRS testing to 0.01 Rad(s)/ sec MKCR / MHCR chip die available RHA (Radiation hardness assured) lot by lot validation testing via ELDR 0.1 Rad (SI)/sec d |
|
|
|
Microsemi |
Rad Hard PNP Silicon Switching Transistor JEDEC registered 2N2907A TID level screened per MIL-PRF-19500 Also available with ELDRS testing to 0.01 Rad(s)/ sec MKCR/MHCR chip die available RHA (Radiation hardness assured) lot by lot validation testing via ELDR 0.1 Rad (SI)/sec dose |
|
|
|
Microsemi |
Rad Hard NPN Silicon Switching Transistor JEDEC registered 2N2222A TID level screened per MIL-PRF-19500 Also available with ELDRS testing to 0.01 Rad(s)/ sec MKCR/MHCR chip die available RHA (Radiation hardness assured) lot by lot validation testing via ELDR 0.1 Rad (SI)/sec dose r |
|
|
|
Microsemi |
Rad Hard NPN Silicon Switching Transistor JEDEC registered 2N2222A TID level screened per MIL-PRF-19500 Also available with ELDRS testing to 0.01 Rad(s)/ sec MKCR/MHCR chip die available RHA (Radiation hardness assured) lot by lot validation testing via ELDR 0.1 Rad (SI)/sec dose r |
|
|
|
Microsemi |
Rad Hard NPN Silicon High Speed Switching Transistor JEDEC registered 2N2369 TID level screened per MIL-PRF-19500 Also available with ELDRS testing to 0.01 Rad(s)/ sec MKCR / MHCR chip die available RHA (Radiation hardness assured) lot by lot validation testing via ELDR 0.1 Rad (SI)/sec d |
|
|
|
Microsemi |
Rad Hard PNP Silicon Switching Transistor JEDEC registered 2N2907A TID level screened per MIL-PRF-19500 Also available with ELDRS testing to 0.01 Rad(s)/ sec MKCR/MHCR chip die available RHA (Radiation hardness assured) lot by lot validation testing via ELDR 0.1 Rad (SI)/sec dose |
|
|
|
Microsemi |
Rad Hard PNP Silicon Switching Transistor JEDEC registered 2N2907A TID level screened per MIL-PRF-19500 Also available with ELDRS testing to 0.01 Rad(s)/ sec MKCR/MHCR chip die available RHA (Radiation hardness assured) lot by lot validation testing via ELDR 0.1 Rad (SI)/sec dose |
|