No. | parte # | Fabricante | Descripción | Hoja de Datos |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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Texas Instruments |
High-Speed CMOS Logic 4-Bit Magnitude Comparator • Buffered inputs and outputs • Typical propagation delay: 13 ns (data to output at VCC = 5 V, CL = 15 pF, TA = 25℃) • Serial or parallel expansion without external gating • Fanout (over temperature range) – Standard outputs: 10 LSTTL loads – Bus dri |
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Texas Instruments |
High-Speed CMOS Logic 4-Bit Magnitude Comparator • Buffered inputs and outputs • Typical propagation delay: 13 ns (data to output at VCC = 5 V, CL = 15 pF, TA = 25℃) • Serial or parallel expansion without external gating • Fanout (over temperature range) – Standard outputs: 10 LSTTL loads – Bus dri |
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Texas Instruments |
High-Speed CMOS Logic 4-Bit Magnitude Comparator • Buffered inputs and outputs • Typical propagation delay: 13 ns (data to output at VCC = 5 V, CL = 15 pF, TA = 25℃) • Serial or parallel expansion without external gating • Fanout (over temperature range) – Standard outputs: 10 LSTTL loads – Bus dri |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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Texas Instruments |
High-Speed CMOS Logic 4-Bit Magnitude Comparator • Buffered inputs and outputs • Typical propagation delay: 13 ns (data to output at VCC = 5 V, CL = 15 pF, TA = 25℃) • Serial or parallel expansion without external gating • Fanout (over temperature range) – Standard outputs: 10 LSTTL loads – Bus dri |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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|
ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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|
ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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ETC |
16/000 Usable PLD Gate QuickRAM ESP Combining Performance/ Density and Embedded RAM up to 16 simultaneous inputs and five outputs within a cell that can be fragmented into five independent cells. Each cell has a fanin of 29 including register and control lines (see Figure 3). WDATA RAM Module (1,152 bits) RDATA WADDR RADDR RAM |
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