No. | parte # | Fabricante | Descripción | Hoja de Datos |
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International Rectifier |
(IRHMJ5x160) RADIATION HARDENED POWER MOSFET SURFACE MOUNT n n n n n n n n n n Single Event Effect (SEE) Hardened Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Ratings Dynamic dv/dt Ratings Simple Drive Requirements Ease of Paralleling Hermatically Sealed Electically Isolated Cera |
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International Rectifier |
RADIATION HARDENED POWER MOSFET THRU-HOLE n n n n n n n n n Single Event Effect (SEE) Hardened Low RDS(on) Low Total Gate Charge Proton Tolerant Simple Drive Requirements Ease of Paralleling Hermetically Sealed Ceramic Package Light Weight Absolute Maximum Ratings Parameter ID @ VGS = -12 |
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International Rectifier |
RADIATION HARDENED POWER MOSFET n n n n n n n n n n Low RDS(on) Fast Switching Single Event Effect (SEE) Hardened Low Total Gate Charge Simple Drive Requirements Ease of Paralleling Hermetically Sealed Ceramic Eyelets Electrically Isolated Light Weight Absolute Maximum Ratings P |
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International Rectifier |
(IRHM5x160) RADIATION HARDENED POWER MOSFET THRU-HOLE |
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International Rectifier |
Radiation Hardened Power MOSFET • Low RDS(on) • Fast switching • Single event effect (SEE) hardened • Low total gate charge • Simple drive requirements • Hermetically sealed • Enhanced ceramic package for direct to pcb mounting • Light weight • Surface mount with low CTE mismatch t |
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International Rectifier |
N-Channel Transistor s s s s s s s s s s s s s Radiation Hardened up to 1 x 10 6 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions |
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International Rectifier |
RADIATION HARDENED POWER MOSFET n n n n n n n n n n Single Event Effect (SEE) Hardened Ultra Low RDS(on) Low Total Gate Charge Proton Tolerant Simple Drive Requirements Ease of Paralleling Hermetically Sealed Surface Mount Ceramic Package Light Weight Absolute Maximum Ratings Pa |
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International Rectifier |
RADIATION HARDENED POWER MOSFET THRU-HOLE n n n n n n n n n Single Event Effect (SEE) Hardened Low RDS(on) Low Total Gate Charge Proton Tolerant Simple Drive Requirements Ease of Paralleling Hermetically Sealed Ceramic Eyelets Light Weight Absolute Maximum Ratings Parameter ID @ VGS = 12V |
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International Rectifier |
RADIATION HARDENED POWER MOSFET |
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International Rectifier |
Radiation Hardened Power MOSFET Single event effect (SEE) hardened (up to LET of 88.2 MeV ·cm2/mg) Low RDS(on) Fast switching Low total gate charge Simple drive requirements Hermetically sealed Electrically isolated Ceramic eyelets Light weight ESD rating: Class |
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International Rectifier |
N-Channel Transistor s Radiation Hardened up to 1 x 105 Rads (Si) s Single Event Burnout (SEB) Hardened s Single Event Gate Rupture (SEGR) Hardened s Gamma Dot (Flash X-Ray) Hardened s Neutron Tolerant s Identical Pre- and Post-Electrical Test Conditions s Repetitive Av |
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International Rectifier |
N-Channel Transistor s Radiation Hardened up to 1 x 105 Rads (Si) s Single Event Burnout (SEB) Hardened s Single Event Gate Rupture (SEGR) Hardened s Gamma Dot (Flash X-Ray) Hardened s Neutron Tolerant s Identical Pre- and Post-Electrical Test Conditions s Repetitive Av |
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International Rectifier |
(IRHN7450 / IRHN8450) HEXFET TRANSISTOR n n n n n n n n n n n n n n n Radiation Hardened up to 1 x 106 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditi |
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International Rectifier |
TRANSISTOR N-CHANNEL s s s s s s s s s s s s s Radiation Hardened up to 1 x 10 5 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions |
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International Rectifier |
N-CHANNEL POWER MOSFET n n n n n n n n n n Single Event Effect (SEE) Hardened Ultra Low RDS(on) Low Total Gate Charge Proton Tolerant Simple Drive Requirements Ease of Paralleling Hermetically Sealed Surface Mount Ceramic Package Light Weight Absolute Maximum Ratings Pa |
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International Rectifier |
RADIATION HARDENED POWER MOSFET THRU-HOLE n n n n n n n n n Single Event Effect (SEE) Hardened Low RDS(on) Low Total Gate Charge Proton Tolerant Simple Drive Requirements Ease of Paralleling Hermetically Sealed Ceramic Eyelets Light Weight Absolute Maximum Ratings Parameter ID @ VGS = 12V |
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International Rectifier |
RADIATION HARDENED POWER MOSFET THRU-HOLE n n n n n n n n n Single Event Effect (SEE) Hardened Ultra Low RDS(on) Low Total Gate Charge Proton Tolerant Simple Drive Requirements Ease of Paralleling Hermetically Sealed Ceramic Package Light Weight Absolute Maximum Ratings Parameter ID @ VGS |
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International Rectifier |
RADIATION HARDENED POWER MOSFET THRU-HOLE n n n n n n n n Single Event Effect (SEE) Hardened Ultra Low RDS(on) Low Total Gate Charge Simple Drive Requirements Ease of Paralleling Hermetically Sealed Ceramic Package Light Weight Absolute Maximum Ratings Parameter ID @ VGS = 12V, TC = 25°C |
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International Rectifier |
RADIATION HARDENED POWER MOSFET THRU-HORE ! ! ! ! ! ! ! ! ! Single Event Effect (SEE) Hardened Low RDS(on) Low Total Gate Charge Proton Tolerant Simple Drive Requirements Ease of Paralleling Hermetically Sealed Ceramic Package Light Weight Absolute Maximum Ratings Parameter ID @ VGS = 12V |
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International Rectifier |
(IRHM7064 / IRHM8064) TRANSISTOR N-CHANNEL s s s s s s s s s s s s s Radiation Hardened up to 1 x 10 6 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions |
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