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Integrated Device Technology |
FAST CMOS 18-BIT REGISTER • Common features: – 0.5 MICRON CMOS Technology – High-speed, low-power CMOS replacement for ABT functions – Typical tSK(o) (Output Skew) < 250ps – Low input and output leakage ≤1µ A (max.) – ESD > 2000V per MIL-STD-883, Method 3015; > 200V using ma |
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Integrated Device Technology |
FAST CMOS OCTAL BUFFER/LINE DRIVERS • Common features: – Low input and output leakage ≤1µA (max.) – CMOS power levels – True TTL input and output compatibility – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) – Meets or exceeds JEDEC standard 18 specifications – Product available in Radiation |
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Integrated Device Technology |
FAST CMOS 8-BIT IDENTITY COMPARATOR − IDT54/74FCT521 equivalent to FASTTM speed − IDT54/74FCT521A 35% faster than FAST − IDT54/74FCT521B 50% faster than FAST − IDT54/74FCT521C 60% faster than FAST − Equivalent to FAST output drive over full temperature and voltage supply extremes − IO |
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Integrated Device Technology |
FAST CMOS 20-BIT BUFFERS • Common features: – 0.5 MICRON CMOS Technology – High-speed, low-power CMOS replacement for ABT functions – Typical tSK(o) (Output Skew) < 250ps – Low input and output leakage ≤1µ A (max.) – ESD > 2000V per MIL-STD-883, Method 3015; > 200V using ma |
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Integrated Device Technology |
FAST CMOS OCTAL BUFFER/LINE DRIVERS • Common features: – Low input and output leakage ≤1µA (max.) – CMOS power levels – True TTL input and output compatibility – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) – Meets or exceeds JEDEC standard 18 specifications – Product available in Radiation |
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Integrated Device Technology |
FAST CMOS OCTAL D REGISTERS (3-STATE) • IDT54/74FCT374/534/574 equivalent to FAST™ speed and drive • IDT54/74FCT374A/534A/574A up to 30% faster than FAST • IDT54/74FCT374C/534C/574C up to 50% faster than FAST • IOL = 48mA (commercial) and 32mA (military) • CMOS power levels (1mW typ. st |
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Integrated Device Technology |
FAST CMOS 8-BIT IDENTITY COMPARATOR • • • • Std., A, B and C speed grades Low input and output leakage ≤1µA (max.) CMOS power levels True TTL input and output compatibility – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) High drive outputs (-15mA IOH, 48mA IOL) Meets or exceeds JEDEC standard |
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Integrated Device Technology |
FAST CMOS OCTAL TRANSPARENT LATCHES • Common features: – Low input and output leakage ≤1µA (max.) – CMOS power levels – True TTL input and output compatibility – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) – Meets or exceeds JEDEC standard 18 specifications – Product available in Radiation |
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Integrated Device |
FAST CMOS OCTAL LATCHED TRANSCEIVER • Common features: – Low input and output leakage ≤1µA (max.) – CMOS power levels – True TTL input and output compatibility – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) – Meets or exceeds JEDEC standard 18 specifications – Product available in Radiation |
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Integrated Device Technology |
BUFFER/LINE DRIVER • • • • • • • • IDT54FCT541 equivalent to FAST™ speed and drive IDT54/74FCT541A up to 25% faster than FAST IDT74FCT541C up to 55% faster than FAST IOL = 64mA (commercial) and 48mA (military) CMOS power levels (1mW typ. static) MIlitary product comp |
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Integrated Device Technology |
3.3V CMOS OCTAL BUFFER/LINE DRIVER • 0.5 MICRON CMOS Technology • ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0) • 25 mil Center SSOP and QSOP Packages • Extended commercial range of -40°C to +85°C • VCC = 3.3V ±0.3V, Normal Range or VCC = 2.7 |
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Integrated Device Technology |
FAST CMOS 8-BIT IDENTITY COMPARATOR • • • • Std., A, B and C speed grades Low input and output leakage ≤1µA (max.) CMOS power levels True TTL input and output compatibility – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) High drive outputs (-15mA IOH, 48mA IOL) Meets or exceeds JEDEC standard |
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Integrated Device Technology |
FAST CMOS OCTAL BUFFER/LINE DRIVER • IDT54/74FCT240/241/244/540/541 equivalent to FASTTM speed and drive • IDT54/74FCT240A/241A/244A/540A/541A 25% faster than FAST • IDT54/74FCT240C/241C/244C/540C/541C up to 55% faster than FAST • IOL = 64mA (commercial) and 48mA (military) • CMOS po |
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Integrated Device Technology |
FAST CMOS 16-BIT BIDIRECTIONAL TRANSCEIVERS • Common features: – 0.5 MICRON CMOS Technology – High-speed, low-power CMOS replacement for ABT functions – Typical tSK(o) (Output Skew) < 250ps – Low input and output leakage ≤ 1µ A (max.) – ESD > 2000V per MIL-STD-883, Method 3015; > 200V using m |
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Integrated Device |
FAST CMOS OCTAL BUFFER/LINE DRIVERS • Common features: – Low input and output leakage ≤1µA (max.) – CMOS power levels – True TTL input and output compatibility – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) – Meets or exceeds JEDEC standard 18 specifications – Product available in Radiation |
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Renesas |
FAST CMOS OCTAL D REGISTERS • Std., A, and C grades • Low input and output leakage ≤1µA (max.) • CMOS power levels • True TTL input and output compatibility: – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) • High Drive outputs (-15mA IOH, 48mA IOL) • Meets or exceeds JEDEC standard 18 |
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Integrated Device Technology |
FAST CMOS OCTAL TRANSPARENT LATCHES • IDT54/74FCT373/533/573 equivalent to FAST™ speed and drive • IDT54/74FCT373A/533A/573A up to 30% faster than FAST • Equivalent to FAST output drive over full temperature and voltage supply extremes • IOL = 48mA (commercial) and 32mA (military) • CM |
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Integrated Device Technology |
FAST CMOS OCTAL D REGISTERS (3-STATE) • IDT54/74FCT374/534/574 equivalent to FAST™ speed and drive • IDT54/74FCT374A/534A/574A up to 30% faster than FAST • IDT54/74FCT374C/534C/574C up to 50% faster than FAST • IOL = 48mA (commercial) and 32mA (military) • CMOS power levels (1mW typ. st |
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Integrated Device Technology |
FAST CMOS 18-BIT R/W BUFFER • • • • • • • • • • • • • • 0.5 MICRON CMOS Technology Typical tSK(o) (Output Skew) < 250ps Low input and output leakage ≤1µ A (max.) ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0) Packages include 25 mil pit |
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Integrated Device Technology |
FAST CMOS 16-BIT BUS TRANSCEIVER/ REGISTERS (3-STATE) direction control (xDIR), over-riding Output Enable control (xOE) and Select lines (xSAB and xSBA) to select either real-time data or stored data. Separate clock inputs are provided for A and B port registers. Data on the A or B data bus, or both, ca |
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Desde 2024. D4U Semiconductor.
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