No. | parte # | Fabricante | Descripción | Hoja de Datos |
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Hitachi Semiconductor |
2SA893A oise figure Cob — 1.8 — — 1.8 NF — 2 10 — 2 Note: 1. The 2SA893/A is grouped by hFE as follows. DE 250 to 500 400 to 800 Max Unit Test conditions —V IC = –1 mA, RBE = ∞ — µA –0.5 µA 800 –0.75 V –0.5 V — MHz — pF VCB = –75 V, IE = 0 VCB = –100 |
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Hitachi Semiconductor |
2SA893 oise figure Cob — 1.8 — — 1.8 NF — 2 10 — 2 Note: 1. The 2SA893/A is grouped by hFE as follows. DE 250 to 500 400 to 800 Max Unit Test conditions —V IC = –1 mA, RBE = ∞ — µA –0.5 µA 800 –0.75 V –0.5 V — MHz — pF VCB = –75 V, IE = 0 VCB = –100 |
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Hitachi Semiconductor |
Silicon PNP Epitaxial Transistor VCE = –6 V, I C = –50 µA Rg = 50 kΩ, f = 1 kHz Min –90 — — Typ — — — — — — 120 1.8 2 –120 — — — 250 — — — — — 120 1.8 2 DC current transfer ratio hFE* Base to emitter voltage VBE Collector to emitter saturation voltage 250 — — — — — –0.75 — –0 |
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Hitachi Semiconductor |
Silicon PNP Epitaxial Transistor VCE = –6 V, I C = –50 µA Rg = 50 kΩ, f = 1 kHz Min –90 — — Typ — — — — — — 120 1.8 2 –120 — — — 250 — — — — — 120 1.8 2 DC current transfer ratio hFE* Base to emitter voltage VBE Collector to emitter saturation voltage 250 — — — — — –0.75 — –0 |
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