No. | parte # | Fabricante | Descripción | Hoja de Datos |
---|---|---|---|---|
|
|
Freescale Semiconductor |
RF Power Field Effect Transistors • 100% PAR Tested for Guaranteed Output Power Capability • Characterized with Series Equivalent Large - Signal Impedance Parameters • Internally Matched for Ease of Use • Integrated ESD Protection • Greater Negative Gate - Source Voltage Range for Im |
|
|
|
Freescale Semiconductor |
RF Power Field Effect Transistors • 100% PAR Tested for Guaranteed Output Power Capability • Characterized with Series Equivalent Large - Signal Impedance Parameters • Internally Matched for Ease of Use • Integrated ESD Protection • Greater Negative Gate - Source Voltage Range for Im |
|
|
|
Freescale Semiconductor |
RF LDMOS Wideband Integrated Power Amplifiers • 100% PAR Tested for Guaranteed Output Power Capability • Production Tested in a Symmetrical Doherty Configuration • Characterized with Series Equivalent Large - Signal Impedance Parameters and Common Source S - Parameters • On - Chip Matching (50 O |
|
|
|
Freescale Semiconductor |
RF LDMOS Wideband Integrated Power Amplifiers • 100% PAR Tested for Guaranteed Output Power Capability • Production Tested in a Symmetrical Doherty Configuration • Characterized with Series Equivalent Large - Signal Impedance Parameters and Common Source S - Parameters • On - Chip Matching (50 O |
|
|
|
Freescale Semiconductor |
RF LDMOS Wideband Integrated Power Amplifiers • 100% PAR Tested for Guaranteed Output Power Capability • Characterized with Series Equivalent Large - Signal Impedance Parameters and Common Source S-Parameters • On - Chip Matching (50 Ohm Input, on a per side basis, DC Blocked) • Internally Match |
|
|
|
Freescale Semiconductor |
RF LDMOS Wideband Integrated Power Amplifiers • 100% PAR Tested for Guaranteed Output Power Capability • Characterized with Series Equivalent Large - Signal Impedance Parameters and Common Source S-Parameters • On - Chip Matching (50 Ohm Input, on a per side basis, DC Blocked) • Internally Match |
|
|
|
Freescale Semiconductor |
RF LDMOS Wideband Integrated Power Amplifiers • Production Tested in a Symmetrical Doherty Configuration • 100% PAR Tested for Guaranteed Output Power Capability • Characterized with Large--Signal Load--Pull Parameters and Common Source S--Parameters • On--Chip Matching (50 Ohm Input, DC Blocked |
|
|
|
Freescale Semiconductor |
RF LDMOS Wideband Integrated Power Amplifiers • Production Tested in a Symmetrical Doherty Configuration • 100% PAR Tested for Guaranteed Output Power Capability • Characterized with Large--Signal Load--Pull Parameters and Common Source S--Parameters • On--Chip Matching (50 Ohm Input, DC Blocked |
|
|
|
Freescale Semiconductor |
RF LDMOS Wideband Integrated Power Amplifiers • 100% PAR Tested for Guaranteed Output Power Capability • Production Tested in a Symmetrical Doherty Configuration • Characterized with Series Equivalent Large - Signal Impedance Parameters and Common Source S - Parameters • On - Chip Matching (50 O |
|
|
|
Freescale Semiconductor |
RF LDMOS Wideband Integrated Power Amplifiers • 100% PAR Tested for Guaranteed Output Power Capability • Characterized with Series Equivalent Large - Signal Impedance Parameters and Common Source S-Parameters • On - Chip Matching (50 Ohm Input, on a per side basis, DC Blocked) • Internally Match |
|