| No. | parte # | Fabricante | Descripción | Hoja de Datos |
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Clare Inc. |
HIGH-ENERGY TRIGGERED SPARK GAPS n Rugged ceramic-metal construction n -55°C to +125°C operating temperature n Short delay time n Compact size n High reliability n Vibration tested to MIL-STD-202D method 204, test conditions A n Thermal shock tested per MIL-STD-202D method 107, test |
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Desde 2024. D4U Semiconductor.
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