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SN74HC10-Q1 |
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| Part Number | SN74HC10-Q1 |
| Manufacturer | Texas Instruments |
| Description | This device contains three independent 3-input NAND gates. Each gate performs the Boolean function Y = A ● B ● C in positive logic. Device Information(1) PART NUMBER PACKAGE BODY SIZE (NOM) SN74HC10QPWRG4Q 1 TSSOP (14) 5.00 mm × 4.40 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Functional pinout of the . |
| Features |
•1 AEC-Q100 Qualified for automotive applications: – Device temperature grade 1: –40°C to +125°C, TA • Buffered inputs • Positive and negative input clamp diodes • Wide operating voltage range: 2 V to 6 V • Supports fanout up to 10 LSTTL loads • Significant power reduction compared to LSTTL logic ICs 2 Applications • Alarm / tamper detect circuit • S-R latch 3 Description This device contains three independent 3-input NAND gates. Each gate performs the Boolean function Y = A ● B ● C in positive logic. Device Information(1) PART NUMBER PACKAGE BODY SIZE (NOM) SN74HC10QPWRG4Q 1 TSSOP (14. |
| Datasheet |
 SN74HC10-Q1 Data Sheet
PDF 889.31KB |
| Distributor | Stock | Price | Buy |
|---|
| No. | Parte # | Fabricante | Descripción | Hoja de Datos |
|---|---|---|---|---|
| 1 | SN74HC10-EP |
Texas Instruments |
TRIPLE 3-INPUT POSITIVE-NAND GATE |
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| 2 | SN74HC10 |
Texas Instruments |
Triple 3-Input NAND Gates |
|
| 3 | SN74HC109 |
Texas Instruments |
DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS |
|
| 4 | SN74HC109N |
Texas Instruments |
DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS |
|
| 5 | SN74HC10D |
Texas Instruments |
Triple 3-Input NAND Gates |
|
| 6 | SN74HC10N |
Texas Instruments |
TRIPLE 3-INPUT POSITIVE-NAND GATES |
|
| 7 | SN74HC11 |
Texas Instruments |
Triple 3-Input AND Gates |
|
| 8 | SN74HC112 |
Texas Instruments |
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS |
|
| 9 | SN74HC112N |
Texas Instruments |
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS |
|
| 10 | SN74HC125 |
Texas Instruments |
Quadruple Buffers |
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Desde 2024. D4U Semiconductor.
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