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SN74ABTH18646A |
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| Part Number | SN74ABTH18646A |
| Manufacturer | Texas Instruments (https://www.ti.com/) |
| Description | The ’ABTH18646A and ’ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices... |
| Features |
From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes D Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings SN54ABTH18646A, SN54ABTH182646A . . . HV PACKAGE (TOP VIEW) 1A2 1A1 1OE GND 1SAB 1CLKAB TDO VCC NC TMS 1CLKBA 1SBA 1DIR GND 1B1 1B2 1B3 1A3 1A4 1A5 GND 1A6 1A7 1A8 1A9 NC VCC 2A1 2A2 2A3 GND 2A4 2A5 2A6 9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61 10 60 11 59 12 58 13 57 14 56 15 55 16 5... |
| Document |
 SN74ABTH18646A Data Sheet
PDF 883.32KB |
| No. | Parte # | Fabricante | Descripción | Hoja de Datos |
|---|---|---|---|---|
| 1 | SN74ABTH18652A |
Texas Instruments |
SCAN TEST DEVICES |
|
| 2 | SN74ABTH182502A |
Texas Instruments |
SCAN TEST DEVICES |
|
| 3 | SN74ABTH182504A |
Texas Instruments |
SCAN TEST DEVICES |
|
| 4 | SN74ABTH182646A |
Texas Instruments |
SCAN TEST DEVICES |
|
| 5 | SN74ABTH182652A |
Texas Instruments |
SCAN TEST DEVICES |
|
| 6 | SN74ABTH18502A |
Texas Instruments |
SCAN TEST DEVICES |
|
Desde 2024. D4U Semiconductor.
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