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SN54ABT18640 |
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| Part Number | SN54ABT18640 |
| Manufacturer | Texas Instruments (https://www.ti.com/) |
| Description | The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard ... |
| Features |
s SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
SN54ABT18640 . . . WD PACKAGE SN74ABT18640 . . . DGG OR DL PACKAGE
(TOP VIEW)
1DIR 1 1B1 2 1B2 3 GND 4 1B3 5 1B4 6 VCC 7 1B5 8 1B6 9 1B7 10 GND 11 1B8 12 1B9 13 2B1 14 2B2 15 2B3 16 2B4 17 GND 18 2B5 19 2B6 20 2B7 21 VCC 22 2B8 23 2B9 24 GND 25
2DIR 26 TDO 27 TMS 28
56 1OE 55 1A1 54 1A2 53 GND 52 1A3 51 1A4 50 VCC 49 ... |
| Document |
 SN54ABT18640 Data Sheet
PDF 552.32KB |
Similar Datasheet
| No. | Parte # | Fabricante | Descripción | Hoja de Datos |
|---|---|---|---|---|
| 1 | SN54ABT18245 |
Texas Instruments |
SCAN TEST DEVICE |
|
| 2 | SN54ABT18245A |
Texas Instruments |
SCAN TEST DEVICES |
|
| 3 | SN54ABT18502 |
Texas Instruments |
SCAN TEST DEVICE |
|
| 4 | SN54ABT18504 |
Texas Instruments |
SCAN TEST DEVICE |
|
| 5 | SN54ABT125 |
Texas Instruments |
QUADRUPLE BUS BUFFER GATES |
|
| 6 | SN54ABT126 |
Texas Instruments |
QUADRUPLE BUS BUFFER GATES |
|
Desde 2024. D4U Semiconductor.
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