SN74ABT8646 |
Part Number | SN74ABT8646 |
Manufacturer | Texas Instruments (https://www.ti.com/) |
Description | The ’ABT8646 and scan-test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Sta... |
Features |
nd scan-test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
A2 A3 GND A4 A5 A6 A7
SN54ABT8646 . . . JT PACKAGE SN74ABT8646 . . . DL OR DW PACKAGE
(TOP VIEW)
CLKAB 1 SAB 2 DIR 3 A1 4 A2 5 A3 6 GND 7 A4 8 A5 9 A6 10 A7 11 A8 12 TDO 13 TMS 14
28 CLKBA 27 SBA 26 OE 25 B1 24 B2 23 B3 ... |
Document |
SN74ABT8646 Data Sheet
PDF 693.00KB |
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