74AHCT1G79-Q100 |
Part Number | 74AHCT1G79-Q100 |
Manufacturer | nexperia (https://www.nexperia.com/) |
Description | The 74AHC1G79-Q100; 74AHCT1G79-Q100 is a single positive-edge triggered D-type flip-flop. Data at the D-input that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition will ... |
Features |
• Automotive product qualification in accordance with AEC-Q100 (Grade 1) • Specified from -40 °C to +85 °C and from -40 °C to +125 °C • Wide supply voltage range from 2.0 to 5.5 V • Overvoltage tolerant inputs to 5.5 V • High noise immunity • CMOS low power dissipation • Latch-up performance exceeds 100 mA per JESD 78 Class II Level A • Symmetrical output impedance • Balanced propagation delays • Input levels: • For 74AHC1G79-Q100: CMOS level • For 74AHCT1G79-Q100: TTL level • ESD protection: • MIL-STD-883, method 3015 exceeds 2000 V • HBM JESD22-A114F exceeds 2000 V • MM JESD22-A115-A exceeds... |
Document |
74AHCT1G79-Q100 Data Sheet
PDF 213.52KB |
No. | Parte # | Fabricante | Descripción | Hoja de Datos |
---|---|---|---|---|
1 | 74AHCT1G79 |
NXP |
Single D-type flip-flop; positive-edge trigger | |
2 | 74AHCT1G79 |
nexperia |
Single D-type flip-flop | |
3 | 74AHCT1G00 |
NXP |
2-input NAND gate | |
4 | 74AHCT1G00 |
Diodes |
SINGLE 2 INPUT POSITIVE NAND GATE | |
5 | 74AHCT1G00 |
nexperia |
2-input NAND gate | |
6 | 74AHCT1G00-Q100 |
nexperia |
2-input NAND gate |